Course Code
MM 732
Course Name
Structural Characterization of Materials
Title of the course
MM 732: Structural Characterization of Materials
Credit structure
| L | T | P | C |
| 0 | 0 | 3 | 3 |
Pre-requisite, if any
None
Course content
Optical microscopy ?? different modes of microscopy, image analysis Scanning electron microscopy ?? secondary electron and backscattered electron imaging, EDS/EPMA X-ray diffraction ?? indexing of XRD patterns, Intensity calculations, particle size effects, lattice parameter determination
Texts/References
B. D. Cullity and S. R. Stock, Elements of X-ray Diffraction, Prentice Hall; 3 ed., 2001R. Egerton, Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, andAEM, Springer, 1st ed. 2005R. Haynes, Optical Microscopy of Materials, Springer, 1984
Instructor(s) name
Prof. Ashutosh Gandhi